Atomic Force Microscopy: Describing the mechanical properties of diverse materials

    Atomic Force Microscopy: Describing the mechanical properties of diverse materials

    In this interview, Camilo Guzmán, Manager of Euro-BioImaging’s Finnish Advanced Light Microscopy Node, explains how to use Atomic force microscope (AFM) – a scanning probe microscopy technique capable of imaging surfaces down to a sub-nanometer resolution.

    Read the interview here.


    Nov 05, 2020 00:00